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Profilometer is intended for topography visualization of the surface with a nanometer separator ability and further calculation of roughness surface parameters according to international ISO 25178: Geometric Product Standard Specifications (GPS) - Surface texture: Areal.
MAIN CHARACTERISTICS OF THE DEVELOPMENT
Scan field (X, Y): 1500x1800 microns. The maximum measured elevation of the relief (Z): 80 microns. Vertical resolution (Z): 5 nm. Scan time: 0. 1 - 2 min. Camera resolution: 1. 3 Mp. The software is compatible with PC computer class and runs on the operating system Windows XP, 7 . The device makes it possible to build two - and three - dimensional surface image, quantify surface characteristics, observe interference pictures in white and in monochromatic light.
INTELLECTUAL PROPERTY STATUS
The patent for a utility model is obtained.
Profilometer can be used in production to control surface quality and critical size of products, control and process optimization of optical components, fiber optic connections, MEMS devices, artificial joints, microelectronics, parts machine and aircraft construction.
THE DEVELOPMENT READINESS STATUS
There was developed a prototype, scanning technique and software. A series of studies in various fields of science has been conducted to confirm the capabilities of the device.