Universal flaw detector for quality control of low electric loads
PURPOSE AND SCOPE
Development is designed to control the homogeneity of electrical parameters of the layers with low electrical conductivity. The control provides detection defects of different nature and is important component for determining the quality of products. The control is required both in the manufacture of products and in the process of their exploitation.
THE ESSENCE OF THE DEVELOPMENT
Layers of various destination and composition are widely used in the technique. The layers often have heterogeneity: pores, cracks, inclusions of other phases, etc. , resulting in significantly reduced their quality. To control the defects in the conditions of production it is necessary such devices that satisfy a range of requirements: versatility, efficiency and low cost of control, locality and high sensitivity of defect detection and the possibility of automation, including integration into the overall quality control system production. The flaw detector satisfies all these requirements, in particular, provides detection of defects with locality of 0. 1 mm and more in layers on planes of products measuring 10´20 cm.
STATE OF INTELLECTUAL PROPERTY PROTECTION
There was received a patent of Ukraine.
The flaw detectors can be used at the enterprises of machine - building, instrument - making and other industries. In Ukraine such devices are not released.
STATUS OF READINESS OF THE DEVELOPMENT
There was made an experimental sample. The expected characteristics were confirmed by testing layers of different composition (semiconductor, high - voltage, etc. ).